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Journal Articles

Recent study of single-event upset induced in semiconductor devices by heavy-ions; Developement of new measurement system TIBIC

Hirao, Toshio; Laird, J. S.; Mori, Hidenobu*; Onoda, Shinobu*; Ito, Hisayoshi

JAERI-Conf 2000-019, p.90 - 92, 2001/02

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-2000-019.pdf

no abstracts in English

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